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Quantitative multichannel NC-AFM data analysis of graphene growth on SiC(0001)

  • Noncontact atomic force microscopy provides access to several complementary signals, such as topography, damping, and contact potential. The traditional presentation of such data sets in adjacent figures or in colour-coded pseudo-three-dimensional plots gives only a qualitative impression. We introduce two-dimensional histograms for the representation of multichannel NC-AFM data sets in a quantitative fashion. Presentation and analysis are exemplified for topography and contact-potential data for graphene grown epitaxially on 6H-SiC(0001), as recorded by Kelvin probe force microscopy in ultrahigh vacuum. Sample preparations by thermal decomposition in ultrahigh vacuum and in an argon atmosphere are compared and the respective growth mechanisms discussed.

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Document Type:Article
Author:Christian Held, Thomas SeyllerORCiD, Roland BennewitzORCiD
Parent Title (English):Beilstein Journal of Nanotechnology
First Page:179
Last Page:185
Year of first Publication:2012
Release Date:2022/08/28
Tag:6H-SiC(0001); FM-AFM; Graphene; KPFM; SPM
Impact:02.374 (2012)
Funding Information:Deutsche Forschungsgemeinschaft within the European Science Foundation project FANAS.
Research Departments:Interaktive Oberflächen
DDC classes:500 Naturwissenschaften und Mathematik / 530 Physik
Open Access:Open Access
Signature:INM 2012/015
Licence (German):License LogoCreative Commons - CC BY - Namensnennung 4.0 International