Quantitative multichannel NC-AFM data analysis of graphene growth on SiC(0001)
- Noncontact atomic force microscopy provides access to several complementary signals, such as topography, damping, and contact potential. The traditional presentation of such data sets in adjacent figures or in colour-coded pseudo-three-dimensional plots gives only a qualitative impression. We introduce two-dimensional histograms for the representation of multichannel NC-AFM data sets in a quantitative fashion. Presentation and analysis are exemplified for topography and contact-potential data for graphene grown epitaxially on 6H-SiC(0001), as recorded by Kelvin probe force microscopy in ultrahigh vacuum. Sample preparations by thermal decomposition in ultrahigh vacuum and in an argon atmosphere are compared and the respective growth mechanisms discussed.
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| Document Type: | Article |
|---|---|
| Author: | Christian Held, Thomas SeyllerORCiD, Roland BennewitzORCiD |
| URN: | urn:nbn:de:bsz:291:415-1461 |
| DOI: | https://doi.org/10.3762/bjnano.3.19 |
| Parent Title (English): | Beilstein Journal of Nanotechnology |
| Volume: | 3 |
| First Page: | 179 |
| Last Page: | 185 |
| Language: | English |
| Year of first Publication: | 2012 |
| Release Date: | 2022/08/28 |
| Tag: | 6H-SiC(0001); FM-AFM; Graphene; KPFM; SPM |
| Impact: | 02.374 (2012) |
| Funding Information: | Deutsche Forschungsgemeinschaft within the European Science Foundation project FANAS. |
| Scientific Units: | Interactive Surfaces |
| DDC classes: | 500 Naturwissenschaften und Mathematik / 530 Physik |
| Open Access: | Open Access |
| Signature: | INM 2012/015 |
| Licence (German): |  Creative Commons - CC BY - Namensnennung 4.0 International |
