Spot profile analysis and lifetime mapping in ultrafast electron diffraction: Lattice excitation of self-organized Ge nanostructures on Si(001)
- Ultrafast high energy electron diffraction in reflection geometry is employed to study the structural dynamics of self-organized Germanium hut-, dome-, and relaxed clusters on Si(001) upon femtosecond laser excitation. Utilizing the difference in size and strain state the response of hut- and dome clusters can be distinguished by a transient spot profile analysis. Surface diffraction from {105}-type facets provide exclusive information on hut clusters. A pixel-by-pixel analysis of the dynamics of the entire diffraction pattern gives time constants of 40, 160, and 390 ps, which are assigned to the cooling time constants for hut-, dome-, and relaxed clusters.
Document Type: | Article |
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Author: | Tim Frigge, Bernd Hafke, Verena Tinnemann, T. Witte, Michael Horn-von Hoegen |
URN: | urn:nbn:de:bsz:291:415-3479 |
DOI: | https://doi.org/10.1063/1.4922023 |
ISSN: | 2329-7778 |
Parent Title (English): | Structural Dynamics |
Volume: | 2 |
Issue: | 3 |
Pagenumber: | 035101 |
Language: | English |
Year of first Publication: | 2015 |
Release Date: | 2022/11/18 |
Tag: | cooling; elemental semiconductors; germanium; high energy electron diffraction; high-speed optical techniques; nanostructured materials |
Impact: | 03.667 (2015) |
Funding Information: | Deutsche Forschungsgemeinschaft through SFB616 “Energy dissipation at surfaces”. |
Scientific Units: | Functional Microstructures |
Innovative Electron Microscopy | |
Open Access: | Open Access |
Signature: | INM 2015/58 |
Licence (German): | ![]() |