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Spot profile analysis and lifetime mapping in ultrafast electron diffraction: Lattice excitation of self-organized Ge nanostructures on Si(001)

  • Ultrafast high energy electron diffraction in reflection geometry is employed to study the structural dynamics of self-organized Germanium hut-, dome-, and relaxed clusters on Si(001) upon femtosecond laser excitation. Utilizing the difference in size and strain state the response of hut- and dome clusters can be distinguished by a transient spot profile analysis. Surface diffraction from {105}-type facets provide exclusive information on hut clusters. A pixel-by-pixel analysis of the dynamics of the entire diffraction pattern gives time constants of 40, 160, and 390 ps, which are assigned to the cooling time constants for hut-, dome-, and relaxed clusters.

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Metadaten
Document Type:Article
Author:Tim Frigge, Bernd Hafke, Verena Tinnemann, T. Witte, Michael Horn-von Hoegen
URN:urn:nbn:de:bsz:291:415-3479
DOI:https://doi.org/10.1063/1.4922023
ISSN:2329-7778
Parent Title (English):Structural Dynamics
Volume:2
Issue:3
Pagenumber:035101
Language:English
Year of first Publication:2015
Release Date:2022/11/18
Tag:cooling; elemental semiconductors; germanium; high energy electron diffraction; high-speed optical techniques; nanostructured materials
Impact:03.667 (2015)
Funding Information:Deutsche Forschungsgemeinschaft through SFB616 “Energy dissipation at surfaces”.
Scientific Units:Functional Microstructures
Innovative Electron Microscopy
Open Access:Open Access
Signature:INM 2015/58
Licence (German):License LogoCreative Commons - CC BY - Namensnennung 4.0 International