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Cerium reduction at the interface between ceria and yttria-stabilised zirconia and implications for interfacial oxygen non-stoichiometry

  • Epitaxial CeO 2 films with different thickness were grown on Y 2 O 3 stabilised Zirconia substrates. Reduction of cerium ions at the interface between CeO 2 films and yttria stabilised zirconia substrates is demonstrated using aberration-corrected scanning transmission electron microscopy combined with electron energy-loss spectroscopy. It is revealed that most of the Ce ions were reduced from Ce 4+ to Ce 3+ at the interface region with a decay of several nanometers. Several possibilities of charge compensations are discussed. Irrespective of the details, such local non-stoichiometries are crucial not only for understanding charge transport in such hetero-structures but also for understanding ceria catalytic properties.

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Document Type:Article
Author:Kepeng Song, Herbert K. Schmid, Vesna Srot, Elisa Gilardi, Giuliano Gregori, Kui Du, Joachim Maier, Peter A. van Aken
Parent Title (English):APL Materials
Year of first Publication:2014
Release Date:2022/11/18
Tag:catalysis; cerium compounds; charge compensation; electron energy loss spectra; epitaxial growth; epitaxial layers; scanning-transmission electron microscopy; stoichiometry
Funding Information:Natural Sciences Foundation of China (Grant No. 51221264). European Union Seventh Framework Program [FP/2007-2013] under Grant Agreement No. 312483 (ESTEEM2).
Groups:Innovative Elektronenmikroskopie
Open Access:Open Access
Signature:INM 2014/33
Licence (German):License LogoCreative Commons - CC BY - Namensnennung 4.0 International