Cerium reduction at the interface between ceria and yttria-stabilised zirconia and implications for interfacial oxygen non-stoichiometry
- Epitaxial CeO 2 films with different thickness were grown on Y 2 O 3 stabilised Zirconia substrates. Reduction of cerium ions at the interface between CeO 2 films and yttria stabilised zirconia substrates is demonstrated using aberration-corrected scanning transmission electron microscopy combined with electron energy-loss spectroscopy. It is revealed that most of the Ce ions were reduced from Ce 4+ to Ce 3+ at the interface region with a decay of several nanometers. Several possibilities of charge compensations are discussed. Irrespective of the details, such local non-stoichiometries are crucial not only for understanding charge transport in such hetero-structures but also for understanding ceria catalytic properties.
Document Type: | Article |
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Author: | Kepeng Song, Herbert K. Schmid, Vesna Srot, Elisa Gilardi, Giuliano Gregori, Kui Du, Joachim Maier, Peter A. van Aken |
URN: | urn:nbn:de:bsz:291:415-4589 |
DOI: | https://doi.org/10.1063/1.4867556 |
ISSN: | 2166-532X |
Parent Title (English): | APL Materials |
Volume: | 2 |
Issue: | 3 |
Pagenumber: | 32104 |
Language: | English |
Year of first Publication: | 2014 |
Release Date: | 2022/11/18 |
Tag: | catalysis; cerium compounds; charge compensation; electron energy loss spectra; epitaxial growth; epitaxial layers; scanning-transmission electron microscopy; stoichiometry |
Funding Information: | Natural Sciences Foundation of China (Grant No. 51221264). European Union Seventh Framework Program [FP/2007-2013] under Grant Agreement No. 312483 (ESTEEM2). |
Section: | 06.03.2014 |
Scientific Units: | Innovative Electron Microscopy |
Open Access: | Open Access |
Signature: | INM 2014/33 |
Licence (German): | Creative Commons - CC BY - Namensnennung 4.0 International |