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High temporal-resolution scanning transmission electron microscopy using sparse-serpentine scan pathways

  • Scanning transmission electron microscopy (STEM) provides structural analysis with sub-angstrom resolution. But the pixel-by-pixel scanning process is a limiting factor in acquiring high-speed data. Different strategies have been implemented to increase scanning speeds while at the same time minimizing beam damage via optimizing the scanning strategy. Here, we achieve the highest possible scanning speed by eliminating the image acquisition dead time induced by the beam flyback time combined with reducing the amount of scanning pixels via sparse imaging. A calibration procedure was developed to compensate for the hysteresis of the magnetic scan coils. A combination of sparse and serpentine scanning routines was tested for a crystalline thin film, gold nanoparticles, and in an in-situ liquid phase STEM experiment. Frame rates of 92, 23 and 5.8 s-1 were achieved for images of a width of 128, 256, and 512 pixels, respectively. The methods described here can be applied to single-particle tracking and analysis of radiation sensitive materials.

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Document Type:Article
Author:Eduardo Ortega, Daniel Nicholls, Nigel D. BrowningORCiD, Niels de JongeORCiD
Parent Title (English):Scientific Reports
First Page:22722
Year of first Publication:2021
Release Date:2022/08/09
Tag:nanoparticles; scanning electron microscopy; transmission electron microscopy
Impact:04.996 (2021)
Funding Information:Deutsche Forschungsgemeinschaft (TFS-STEM)
Groups:Innovative Elektronenmikroskopie
DDC classes:500 Naturwissenschaften und Mathematik / 530 Physik
Open Access:Open Access
Signature:INM 2021/144
Licence (German):License LogoCreative Commons - CC BY - Namensnennung 4.0 International